Plant Image Analysis Plant Image Analysis

CompuEye

Ehab Bakr @ Plant Protection Research Institute
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Scientific article

A new software for measuring leaf area, and area damaged by Tetranychus urticae Koch.
Bakr, E. M.
2005 Journal of Applied Entomology 129 (3), 173-175.

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Description

The Compu Eye, Leaf and Symptoms software provides an easy method to measure total leaf area and the area of any visible symptom on the leaf.



Source: Bakr (2005) Journal of Applied Entomology 129 (3), 173-175.

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Overview
Operating system
windows,

Licence
freeware,

Measured variables
disease, surface,

Automation level
automated,

Plant requirements
any,

Image requirements
unknown,

Export formats
unknown,

Other information
-